FORESITE公司在美國(guó)是具有有影響力的性的專(zhuān)業(yè)級(jí)之檢測(cè)實(shí)驗(yàn)室，它可提供以下專(zhuān)業(yè)的檢測(cè)測(cè)試。

測(cè)試各式電子產(chǎn)品之正負(fù)離子殘留值，并提供專(zhuān)業(yè)的檢測(cè)報(bào)告。

檢測(cè)方式：IPC TM 650.2.3.28 (Ionic Analysis of circuit boards,ion chrom atography method)

C3用途

Monitoring tool for production floor

Focus on sensitive area of concern (0.1 in2)

聚焦在問(wèn)題的萃取面積為0.1in2

Performs electrical test and gives immediate ‘clean’ or ‘dirty’ reading based on Foresite recommended limits for ionic contamination

進(jìn)行電氣測(cè)試并在Foresite建議的離子污染限值基礎(chǔ)上給予“清潔”或“污染”的清潔度判定結(jié)果

Localized extraction method for Ion Chromatography

Extracts sample from localized testing area using deionized steam

使用去離子水蒸汽萃取局部測(cè)試區(qū)的樣品

Samples can be shipped to a lab for Ion Chromatography analysis

萃取后的樣品直接進(jìn)行IC分析

C-3測(cè)試元件操作：for IC( 離子濃度色譜分析儀)

Localized Extraction by C3 & Test per IPC-TM- 650 Standard 2.3.28

C3局部萃取法IPC-TM- 650 Standard 2.3.28

Uses D.I. Water (Steam) 使用DI水（蒸汽）

Dilution factor for I.C. is based on Cell Aperture (0.1in2)

IC的稀釋因子取決于測(cè)試頭的孔徑(0.1in2)

Dilution factor is (2.2mL / 0.1in2 = 22)

稀釋因子計(jì)算公式是 (2.2ml/0.1in2=22)

For Populated Boards add 10% (2.2mL / 0.11in2 = 20)

對(duì)于組裝后的板面積需要增加10%（2.2ml/0.11in2=20)

離子測(cè)試曲線(xiàn)

測(cè)試吸嘴